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XQ4000E/EX QML High-Reliability FPGAs

XQ4000E/EX QML High-Reliability FPGAs Series Datasheet

Testing of the switching parameters is modeled after testing methods specified by MIL-M-38510/605. All devices are 100% functionally tested. Internal timing parameters are derived from measuring internal test patterns. Listed below are representative values where one global clock input drives one vertical clock line in each accessible column, and where all accessible IOB and CLB flip-flops are clocked by the global clock net.


Qty Required:   Part #:  
   - OR -   
Select from our Available Inventory for an Immediate Price Quote
5962-9850901QZC XQ4005E-4CB164M XQ4005E-4PG156M XQ4010E-4PG191M
XQ4013E-3HQ240N XQ4013E-4PG223M XQ4025E-4CB228M XQ4028EX-4BG352N
XQ4028EX-4BGG352N XQ4028EX-4CB228B XQ4028EX-4CB228M XQ4028EX-4HQ240N
XQ4028EX-4PG299M
XQ4000E/EX QML High-Reliability FPGAs Package Types
family combined
Plastic Ball Grid Array (PBGA)
family combined
Plastic Quad Flat-Pack (PQFP)
XQ4000E/EX QML High-Reliability FPGAs Series Part Photos
additional photos
Additional Images ( 1 )
XQ4010E-4PG191M photos
XQ4010E-4PG191M (3)

XQ4000E/EX QML High-Reliability FPGAs


Qty Required:   Part #:  
   - OR -   

Ordering Information
Select from our Available Inventory for an Immediate Price Quote
5962-9850901QZC XQ4005E-4CB164M XQ4005E-4PG156M XQ4010E-4PG191M
XQ4013E-3HQ240N XQ4013E-4PG223M XQ4025E-4CB228M XQ4028EX-4BG352N
XQ4028EX-4BGG352N XQ4028EX-4CB228B XQ4028EX-4CB228M XQ4028EX-4HQ240N
XQ4028EX-4PG299M

XQ4000E/EX QML High-Reliability FPGAs


Qty Required:   Part #:  
   - OR -   

Marking Information
XQ4000E/EX QML High-Reliability FPGAs Marking Information
XQ4010E-4PG191M
XILINX XQ4010E PG191CKJ0037 F1145813A 4M

XQ4000E/EX QML High-Reliability FPGAs


Qty Required:   Part #:  
   - OR -   

XQ4000E/EX QML High-Reliability FPGAs Part Photos
additional photos
XQ4000E/EX QML High-Reliability FPGAs
XQ4010E-4PG191M photos
XQ4010E-4PG191M
XQ4010E-4PG191M photos
XQ4010E-4PG191M
XQ4010E-4PG191M photos
XQ4010E-4PG191M

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